Plant Genome II Conference
Town & Country Conference Center, San Diego, CA, January, 1994.
PG-II: IDENTIFICATION OF DNA MARKERS LINKED TO BUNT RESISTANCE GENE IN
WHEAT
IDENTIFICATION OF DNA MARKERS LINKED TO BUNT RESISTANCE GENE IN
WHEAT.
T. Demeke, A. Laroche, and D.A. Gaudet. Agriculture and Agri-food
Canada, Lethbridge Research Station, P.O. Box 3000 Main,
Lethbridge, AB, Canada T1J 4B1.
Common bunt, caused by Tilletia spp., may result in
substantial yield reduction and quality loss of wheat in the
Canadian Prairies. Fungicides are routinely used to treat seeds
before planting. The resistant gene Bt10 is effective against
all known races of common bunt and most races of dwarf bunt (T.
controversa). The objective of this study is to identity RAPD
markers linked to the Bt10 gene. Genomic DNA of two near-
isogenic wheat lines for the Bt10 gene, BW553 (resistant) and
Neepawa (susceptible), were screened with over 900 UBC and
Operon primers. A low level of polymorphism (< 1 %) was obtained
with the primers used. Some primers showed transient
polymorphism. One primer (C rich) showed a distinct fragment of
590 bp in the resistant line. This polymorphic fragment was
cloned and sequenced, and further analysis was made with SCAR
primers. Consistent polymorphism was observed for the
polymorphic fragment in different wheat lines carrying the Bt10
gene. A segregating population will be used for linkage analysis
and mapping. The results achieved so far and the problems
encountered will be discussed.
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