Plant Genome II Conference
Town & Country Conference Center, San Diego, CA, January, 1994.
PG-II: STUDY OF A LEAF RUST RESISTANCE GENE CARRIED BY A xMV
CHROMOSOME OF Aegilops ventricosa
STUDY OF A LEAF RUST RESISTANCE GENE CARRIED BY A xMV
CHROMOSOME OF Aegilops ventricosa.
A. Bonhomme(l), J. Jahier(2), P. Nicolas(3), M. Bernard (1)
(1) INRA, 63039 Clermont-Ferrand cedex, France. (2) INRA, 35650
Le Rheu, France. (3) Universite Blaise Pascal, 63000
Clermont-Ferrand, France.
A leaf rust resistance gene carried by a chromosome of the
Aegilops ventricosa MV genome has been introduced in the
hexaploid wheat Moisson. The constitution of the chromosome xMV
found in a wheat alien chromosome addition line (Moisson + xMV),
a deleted addftion line (Moisson + xMV deleted for the Lr gene)
and a substitution line (Mooisson 6D, + xMV) was studied. The
part of this chromosome conferring resistance to leaf rust was
identified using 68 wheat probes.
This RFLP analysis showed that:
--the xMV found in the addition line v260 was originated from
Aegilops ventricosa N 10,
--xMV was a rearranged chromosome, constituted with a large part
of the 6MV (deleted for a piece of its short arm) and a fragment
of a chromosome 2 (2MV or 2DV) of Aegilops ventricosa
translocated on the long arm of the 6MV,
--a chromosomal segment of the xMV, composed of 2 loci (PSR 150,
PSR 933) and of the Lr gene, was introduced in the chromosome 2A
of Moisson by homoeologous recombination (in the line 22).
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